The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Mar. 16, 2018
Applicant:
Lockheed Martin Corporation, Bethesda, MD (US);
Inventors:
Alexander M. Elhage, Endicott, NY (US);
Michael Riess, South Glens Falls, NY (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06T 7/33 (2017.01); G06T 5/20 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); H04N 1/191 (2006.01); H04N 1/387 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4038 (2013.01); G06T 5/002 (2013.01); G06T 5/003 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 7/33 (2017.01); G06T 7/337 (2017.01); H04N 1/1911 (2013.01); H04N 1/387 (2013.01); G06T 2207/20216 (2013.01); G06T 2207/30176 (2013.01);
Abstract
The disclosure is directed to systems and methods for image capturing technologies and, more particularly, to a slice scan imaging system and respective processes to achieve high quality images. The method can be implemented in a computing device, which includes: capturing multiple lines of an image in a single slice; capturing multiple slices; stitching together the multiple slices by aligning common features of the images of a previous slice with a successive slice; and blending together the stitched together multiple slices.