The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Dec. 13, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Wei Sun, Tarrytown, NY (US);

Roman Vaculin, Bronxville, NY (US);

Jinfeng Yi, Ossining, NY (US);

Nianjun Zhou, Danbury, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/0454 (2013.01); G06N 5/022 (2013.01);
Abstract

Techniques that facilitate machine learning using multi-dimensional time series data are provided. In one example, a system includes a snapshot component and a machine learning component. The snapshot component generates a first sequence of multi-dimensional time series data and a second sequence of multi-dimensional time series data from multi-dimensional time series data associated with at least two different data types generated by a data system over a consecutive period of time. The machine learning component that analyzes the first sequence of multi-dimensional time series data and the second sequence of multi-dimensional time series data using a convolutional neural network system to predict an event associated with the multi-dimensional time series data.


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