The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Feb. 24, 2018
Applicant:
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Inventors:
Melih Kandemir, Cekmekoy, TR;
Fred Hamprecht, Heidelberg, DE;
Christian Wojek, Aalen, DE;
Ute Schmidt, Amoeneburg, DE;
Assignee:
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6263 (2013.01); G06K 9/6256 (2013.01); G06K 9/6278 (2013.01); G06K 9/6284 (2013.01);
Abstract
An event classification is trained by machine learning. An anomaly detection for detecting events in an image data set is thereby performed. Based on the performance of the anomaly detection, a model assumption of the event classification is determined. An image data set may include a plurality of images, and each image may include an array of pixels. Further, an image data set may include volume data and/or a time sequence of images and in this way represent a video sequence.