The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Feb. 04, 2019
Tokitae Llc, Bellevue, WA (US);
Matthew Horning, Redmond, WA (US);
Liming Hu, Kent, WA (US);
Shawn McGuire, Seattle, WA (US);
Courosh Mehanian, Redmond, WA (US);
Tokitae, LLC, Bellevue, WA (US);
Abstract
Techniques and technologies for automated microscopy scanning systems are disclosed wherein a microscopy system performs 'hunt mode' operations at coarsely-spaced locations throughout a scanning window until an acceptable quality scan result is achieved. The system then performs detailed scans at all fields of view within a grid cell that includes the location having the acceptable scan result. The system performs another evaluation of the scan results for the entire grid cell, and if the scan results for the grid cell are collectively acceptable, then the system proceeds to perform 'scan mode' operations. The scan mode operations include scanning and evaluating all of the fields of view within one or more grid cells adjacent to the acceptable grid cell from the hunt mode operations. The system may successively perform hunt mode operations and scan mode operations, compiling information regarding one or more aspects of the scanning process, until one or more termination criteria are satisfied.