The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Sep. 19, 2018
Applicant:

Huazhong University of Science and Technology, Hubei, CN;

Inventors:

Song Wu, Hubei, CN;

Zhuang Xiong, Hubei, CN;

Hai Jin, Hubei, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01); G06F 11/30 (2006.01); G06K 9/62 (2006.01); G06F 11/34 (2006.01); G06N 20/00 (2019.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/008 (2013.01); G06F 11/079 (2013.01); G06F 11/0727 (2013.01); G06F 11/0766 (2013.01); G06F 11/2221 (2013.01); G06F 11/2268 (2013.01); G06F 11/2273 (2013.01); G06F 11/3034 (2013.01); G06F 11/3442 (2013.01); G06F 11/3485 (2013.01); G06K 9/6269 (2013.01); G06N 20/00 (2019.01); G06F 2201/81 (2013.01);
Abstract

An S.M.A.R.T. threshold optimization method used for disk failure detection includes the steps of: analyzing S.M.A.R.T. attributes based on correlation between S.M.A.R.T. attribute information about plural failed and non-failed disks and failure information and sieving out weakly correlated attributes and/or strongly correlated attributes; and setting threshold intervals, multivariate thresholds and/or native thresholds corresponding to the S.M.A.R.T. attributes based on distribution patterns of the strongly or weakly correlated attributes. As compared to reactive fault tolerance, the disclosed method has no negative effects on reading and writing performance of disks and performance of storage systems as a whole. As compared to the known methods that use native disk S.M.A.R.T. thresholds, the disclosed method significantly improves disk failure detection rate with a low false alarm rate. As compared to disk failure forecast based on machine learning algorithm, the disclosed method has good interpretability and allows easy adjustment of its forecast performance.


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