The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Jun. 04, 2019
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Jorge Guerra Delgado, Sunnyvale, CA (US);

Jin Zhang, Palo Alto, CA (US);

Radhika Vullikanti, Palo Alto, CA (US);

Abhishek Gupta, Palo Alto, CA (US);

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 16/23 (2019.01); G06F 16/174 (2019.01); G06F 9/455 (2018.01); G06F 16/25 (2019.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0647 (2013.01); G06F 3/067 (2013.01); G06F 3/0608 (2013.01); G06F 3/0641 (2013.01); G06F 16/2365 (2019.01); G06F 3/0617 (2013.01); G06F 9/45558 (2013.01); G06F 16/174 (2019.01); G06F 16/1744 (2019.01); G06F 16/25 (2019.01); G06F 2009/45579 (2013.01); H04L 67/1097 (2013.01);
Abstract

A logical group of data blocks stored in a first node is migrated to a second node according to a method that includes determining a first metric for each logical group of data blocks stored in the first node, the first metric representing a total size of the data blocks in the logical group, determining a second metric for each logical group of data blocks stored in the first node, the second metric representing a total size of the data blocks in the logical group that are uniquely stored in the first node, and selecting a logical group of data blocks for migration from the first node to the second node based on the first metric and the second metric.


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