The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Mar. 09, 2017
Applicant:
Lg Chem, Ltd., Seoul, KR;
Inventors:
Jin Seok Byun, Daejeon, KR;
Ja Pil Koo, Daejeon, KR;
Boo Kyung Kim, Daejeon, KR;
Seok Hoon Jang, Daejeon, KR;
Yeong Rae Chang, Daejeon, KR;
Assignee:
LG CHEM, LTD., Seoul, KR;
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/11 (2015.01); G02B 1/12 (2006.01); C08L 27/12 (2006.01); C08L 33/10 (2006.01); C08L 83/04 (2006.01); C08C 19/40 (2006.01); B32B 7/02 (2019.01); B32B 27/08 (2006.01); B32B 27/18 (2006.01); C09D 5/00 (2006.01); G02B 1/113 (2015.01); G02B 5/18 (2006.01); C09D 4/06 (2006.01); G01N 23/207 (2018.01); C09D 5/33 (2006.01); B32B 7/023 (2019.01); G02B 1/14 (2015.01); C09D 7/40 (2018.01); B05D 3/02 (2006.01); B05D 3/06 (2006.01); C09D 135/02 (2006.01); G02B 1/115 (2015.01); C08J 7/04 (2020.01); C09D 4/00 (2006.01); C08K 7/18 (2006.01); C09D 7/61 (2018.01); C08K 3/01 (2018.01); B05D 1/28 (2006.01); C08K 3/36 (2006.01); C08K 7/26 (2006.01);
U.S. Cl.
CPC ...
G02B 1/11 (2013.01); B05D 3/0254 (2013.01); B05D 3/067 (2013.01); B32B 7/02 (2013.01); B32B 7/023 (2019.01); B32B 27/08 (2013.01); B32B 27/18 (2013.01); C08C 19/40 (2013.01); C08J 7/042 (2013.01); C08L 27/12 (2013.01); C08L 33/10 (2013.01); C08L 83/04 (2013.01); C09D 4/00 (2013.01); C09D 4/06 (2013.01); C09D 5/00 (2013.01); C09D 5/004 (2013.01); C09D 5/006 (2013.01); C09D 7/67 (2018.01); C09D 135/02 (2013.01); G01N 23/207 (2013.01); G02B 1/113 (2013.01); G02B 1/115 (2013.01); G02B 1/12 (2013.01); G02B 1/14 (2015.01); G02B 5/18 (2013.01); B05D 1/28 (2013.01); B32B 2264/102 (2013.01); B32B 2264/12 (2013.01); C08J 2301/02 (2013.01); C08J 2435/02 (2013.01); C08K 3/01 (2018.01); C08K 3/36 (2013.01); C08K 7/18 (2013.01); C08K 7/26 (2013.01); C08K 2201/011 (2013.01); C08L 2203/16 (2013.01); C09D 7/61 (2018.01);
Abstract
The present invention relates to an antireflection film which exhibits one extremum at a thickness of 35 nm to 55 nm from the surface and exhibiting one extremum at a thickness of 85 nm to 105 nm from the surface in a graph showing the result of Fourier transform analysis for the result of X-ray reflectivity measurement using Cu—K-alpha rays.