The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Oct. 29, 2018
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Yoshinao Yanagisawa, Minowa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/23 (2010.01); G01S 19/26 (2010.01); B60G 17/019 (2006.01); B60G 17/018 (2006.01); G01S 19/49 (2010.01); B60G 17/0185 (2006.01);
U.S. Cl.
CPC ...
G01S 19/23 (2013.01); B60G 17/018 (2013.01); B60G 17/019 (2013.01); B60G 17/0182 (2013.01); B60G 17/0185 (2013.01); G01S 19/26 (2013.01); G01S 19/49 (2013.01); B60G 2400/05 (2013.01); B60G 2800/01 (2013.01);
Abstract

A physical quantity detection circuit includes a physical quantity signal generation circuit that generates a physical quantity signal according to magnitude of a physical quantity based on a detection signal output from a physical quantity detection element, an abnormality determination circuit that determines whether or not the physical quantity detection element is potentially abnormal based on a value of the physical quantity signal and an amount of change of the value of the physical quantity signal, and an abnormality diagnostic circuit that diagnoses whether or not the physical quantity detection element is abnormal if the abnormality determination circuit determines that the physical quantity detection element is potentially abnormal.


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