The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Dec. 22, 2017
Applicant:
Numares Ag, Regensburg, DE;
Inventors:
Markus Fuhrmann, Maxhuette-Haidhof, DE;
Maximilian Zucker, Munich, DE;
Assignee:
numares AG, Regensburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/46 (2006.01); G01R 33/465 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4625 (2013.01); G01R 33/46 (2013.01); G01R 33/465 (2013.01); H01J 49/0009 (2013.01);
Abstract
A method for determining proper functioning of an analytic system includes: a) measuring a control composition with an analytic system, the functioning of which is to be determined, to obtain a control result; b) analyzing the control result for predefined test criteria; and c) determining the functioning of the analytic system based on the analysis of step b). The control result includes signals distributed over a whole result space that equals a result space of the analytic system resulting from a measurement of a sample on the analytic system.