The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Aug. 24, 2018
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Toshiba Energy Systems & Solutions Corporation, Kawasaki, JP;
Setsu Yamamoto, Yokohama, JP;
Azusa Sugawara, Kawasaki, JP;
Jun Semboshi, Yokohama, JP;
Kentaro Tsuchihashi, Yokohama, JP;
Masaru Otsuka, Ota, JP;
KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;
Toshiba Energy Systems & Solutions Corporation, Kawasaki, JP;
Abstract
According to an embodiment, a linear-scan ultrasonic inspection apparatus comprises: an ultrasonic array probe having ultrasonic elements aligned in a first direction; a delay-time calculator configured to calculate, referring to the surface shape of the test object, values of delay time of at least one of transmitting and receiving ultrasonic wave; an overlapping-region adjustor configured to set conditions for generating an image of an overlapping region; and an integrated-image generator configured to generate first image data of a region including the overlapping region. The overlapping-region adjustor is configured to set the conditions of the surface shape to be referred to the delay-time calculator in calculating the values of the delay time at either the first-probe setting position or the second-probe setting position as both of a first acquired shape obtained at the first-probe setting position and a second acquired shape obtained at the second-probe setting position.