The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Aug. 14, 2018
Applicant:
Southwest Research Institute, San Antonio, TX (US);
Inventors:
Jonathan D. Bartlett, San Antonio, TX (US);
Albert J. Parvin, Jr., San Antonio, TX (US);
Assignee:
Southwest Research Institute, San Antonio, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01); G01N 27/72 (2006.01); G01R 31/02 (2006.01); G01R 33/12 (2006.01); G01R 35/00 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9033 (2013.01);
Abstract
A conforming eddy current testing (ECT) probe for performing eddy current testing when placed on the surface of a test object. An eddy current array is fabricated on a flexible substrate. A shape metal alloy (SMA) piece is manufactured to have an original shape that conforms to the surface of the test object, and then affixed to the substrate. The SMA piece has as much or more flexibility than the substrate, so that it can be manipulated into position. Just prior to testing, the SMA piece is actuated to revert to its original shape.