The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Jun. 10, 2016
Konica Minolta, Inc., Tokyo, JP;
Shinichi Muramatsu, Hino, JP;
Keizou Takano, Osaka, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
Provided is a measurement method with which an analyte in a sample containing a high concentration of the analyte can be measured with high accuracy without diluting the sample in multiple stages. An embodiment of the present invention relates to a measurement method for measuring an amount of an analyte in a sample, the method including: a binding step of providing the sample to a containing part of a measuring chip including the containing part for containing liquid, and a first capture body immobilized inside the containing part and having a recognition site that specifically binds to the analyte so as to bind the analyte contained in the sample to the first capture body; and a measurement step of measuring an amount of the analyte bound to the first capture body. The measurement method includes an adjustment step in which a second capture body having a recognition site that specifically binds to the analyte is bound to a part of the analyte in the sample in parallel with the binding step or before the binding step so as to reduce the amount of the analyte capable of binding to the first capture body.