The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Dec. 26, 2018
Central Iron and Steel Research Institute, Beijing, CN;
Dongling Li, Beijing, CN;
Xuejing Shen, Beijing, CN;
Lei Zhao, Beijing, CN;
Haizhou Wang, Beijing, CN;
Weihao Wan, Beijing, CN;
Bing Han, Beijing, CN;
Yuhua Lu, Beijing, CN;
Feifei Feng, Beijing, CN;
Chao Li, Beijing, CN;
CENTRAL IRON AND STEEL RESEARCH INSTITUTE, Beijing, CN;
Abstract
The invention belongs to the technical field of the quantitative statistical distribution analysis of the features from characteristic images of microstructures and precipitated phases in metal materials, and relates to a quantitative statistical distribution characterization method of precipitate particles with the full field of view in a metal material. The method comprises the following steps of electrolytic corrosion of a metallic material specimen, automatic collection of characteristic images of microstructure, automatic stitching and fusion of the full-view-field microstructure images, automatic identification and segmentation of the precipitate particles and quantitative distribution characterization of the precipitate particles with the full field of view in a large-range scale. By establishing a mathematic model, the large-range automatic stitching and fusion of the characteristic images of the full-view-field microstructures in a characteristic region and the automatic segmentation and identification of the precipitate particles are realized; and the quantitative statistical distribution characterization information of the full-view-field morphology, quantity, size, distribution and the like of plentiful precipitated phases in a larger range is quickly obtained. The method has the features of being accurate, high-efficiency and informative in quantitative distribution characterization, as well as has much more statistical representativeness compared with conventional single-view-field quantitative image analysis.