The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Feb. 08, 2019
Amo Groningen B.v., Groningen, NL;
Robert Rosen, Groningen, NL;
Mihai State, Groningen, NL;
Marrie van der Mooren, Groningen, NL;
Mengchan Sun, Groningen, NL;
Hendrik A. Weeber, Groningen, NL;
Tjeerd Zuidema, Groningen, NL;
AMO Groningen B.V., Groningen, NL;
Abstract
A multi-wavelength wavefront system and method for measuring diffractive lenses. A system may include one or more light sources configured to emit a plurality of wavelengths of light for diffraction by a diffractive lens. A light sensor may be configured to receive the light that is diffracted by the diffractive intraocular lens. A processor may be configured to determine one or more of the plurality of wavelengths that have a peak diffraction efficiency for the diffractive intraocular lens based on the light received by the light sensor.