The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Jun. 08, 2018
Applicant:

Government of the United States As Represented BY the Secretary of the Air Force, Wright-Patterson AFB, OH (US);

Inventors:

Joseph D. Miller, Bellbrook, OH (US);

Zhili Zhang, Knoxville, TN (US);

Yue Wu, Knoxville, TN (US);

Mark Gragston, Knoxville, TN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01K 1/00 (2006.01); G01J 5/36 (2006.01); G01J 5/60 (2006.01); F23N 5/26 (2006.01); F23N 5/00 (2006.01); F01D 25/00 (2006.01);
U.S. Cl.
CPC ...
G01J 5/36 (2013.01); F01D 25/005 (2013.01); F23N 5/00 (2013.01); F23N 5/265 (2013.01); G01J 5/0014 (2013.01); G01J 5/601 (2013.01); F23N 2225/08 (2020.01);
Abstract

A method of measuring a temperature of a thermally-insulated, high temperature system. The method includes directing a first electromagnetic energy into the high temperature system so that the first electromagnetic energy may cause multi-photon ionization of a molecular or atomic species within the high temperature system. A second electromagnetic energy resulting from the multi-photon ionization is detected through a thermally-insulating wall of the high temperature system. The detected second electromagnetic energy is related to a temperature within the high temperature system.


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