The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Oct. 29, 2018
Applicant:

Ap Robotics, Llc, Rockville, MD (US);

Inventors:

Kam Chiu Lau, Potomac, MD (US);

Guangkun Li, Woodstock, MD (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01B 11/2518 (2013.01); G01B 11/2545 (2013.01);
Abstract

A system is provided for gathering information and data on the surface characteristics of an object includes a projector, a table, a first camera and a second camera. The projector is suspended above the table and arranged to project a random pattern of optical indicators onto the table. The optical indicators can be dots, lines, or other such indicators. The table is arranged to hold the object to be inspected. The first camera is positioned above and to one side of the table and angled toward the table. The second camera is positioned above and to opposite side of the table and angled toward the table. The first and second cameras are arranged to capture images of the optical indicators projected onto the object. The system is further arranged to gather information and data from the captured images and determine the surface characteristics of the object from said gathered information and data.


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