The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Nov. 03, 2017
Applicant:

Toshiba Medical Systems Corporation, Otawara, JP;

Inventors:

Kazuo Imagawa, Nasushiobara, JP;

Yoshiyasu Hayashi, Nasushiobara, JP;

Masahiro Ozawa, Sakura, JP;

Ko Fuchigami, Otawara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/04 (2006.01); A61B 6/00 (2006.01); A61B 6/10 (2006.01); A61K 49/04 (2006.01); A61B 6/06 (2006.01);
U.S. Cl.
CPC ...
A61B 6/0407 (2013.01); A61B 6/107 (2013.01); A61B 6/4411 (2013.01); A61B 6/4441 (2013.01); A61B 6/547 (2013.01); A61K 49/04 (2013.01); A61B 6/06 (2013.01);
Abstract

According to one embodiment, an X-ray diagnostic apparatus includes a holding device and processing circuitry. The holding device movably holds an X-ray generator and an X-ray detector. The processing circuitry generates an X-ray image of the subject, based on an output of the X-ray detector. The processing circuitry sets an interference judgment region between the holding device and an interference object, based on a landmark in the X-ray image. The processing circuitry controls movement of the holding device, based on the set interference judgment region.


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