The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Feb. 19, 2019
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Suh Wuk Kim, Kawasaki, JP;

Hiroki Kudo, Kawasaki, JP;

Sakie Nagakubo, Kawasaki, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04Q 9/02 (2006.01); H04W 84/18 (2009.01);
U.S. Cl.
CPC ...
H04Q 9/02 (2013.01); H04Q 2209/40 (2013.01); H04Q 2209/826 (2013.01); H04W 84/18 (2013.01);
Abstract

According to one embodiment, a data transmission device, includes: a wireless transmitting circuitry transmitting a wireless signal; measurement circuitry measuring a state of a measurement target at a first sampling rate and acquiring a first measurement value of the state of the measurement target; and controlling circuitry determining whether the first measurement value satisfies a first condition based on a first threshold value. The wireless transmitting circuitry transmits the plurality of first measurement values acquired before the first condition is satisfied when the first condition is satisfied. The measurement circuitry switches the first sampling rate to a second sampling rate higher than the first sampling rate when the first condition is satisfied, measures a state of the measurement target at the second sampling rate, and acquires a second measurement value of the state of the measurement target. The wireless transmitting circuitry transmits the second measurement value.


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