The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Feb. 21, 2019
Apple Inc., Cupertino, CA (US);
Bo Yang, Santa Clara, CA (US);
Xiang Lu, Campbell, CA (US);
Andrew J. Copperhall, Redwood City, CA (US);
Henry C. Jen, Los Altos, CA (US);
Karthik Manickam, Santa Clara, CA (US);
Sagar Nataraj, San Jose, CA (US);
Shriram Vijayakumar, Santa Clara, CA (US);
Derek K. Shaeffer, Redwood City, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Design-for-test (DFT) architectures, and methods of testing an array of chips, which may be identical, are described. In an embodiment, a comparison circuit includes a plurality of comparators to compare scan-data out (SDO) data streams with an expected data stream and transmit a compared data stream that is indicated of whether or not an error exists in any of the SDO data streams.