The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Mar. 02, 2018
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Mahdi Farrokh Baroughi, Santa Clara, CA (US);

Mohammad B. Vahid Far, San Jose, CA (US);

Xiang Lu, Campbell, CA (US);

Bo Yang, Santa Clara, CA (US);

Derek K. Shaeffer, Redwood City, CA (US);

Henry C. Jen, Los Altos, CA (US);

Hopil Bae, Sunnyvale, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G09G 3/36 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/367 (2013.01); G09G 2310/0275 (2013.01);
Abstract

The present techniques are capable of identifying and pinpointing defective microdrivers and/or row/column drivers either before or after any μLEDs have been placed on the display. Using the architectures described herein, test data may be delivered in a parallel fashion to the drivers from support circuitry, such as a timing controller and/or a main board, and outputs based on the test data may be similarly delivered back to the support circuitry do determine which drivers are defective. This yields access to the output of every microdriver and row drier, thus enabling the identification of specific defective elements.


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