The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Oct. 10, 2017
Nitto Denko Corporation, Ibaraki, JP;
Yoichi Kigawa, Ibaraki, JP;
NITTO DENKO CORPORATION, Ibaraki, JP;
Abstract
An inspection apparatus configured to inspect a target for defects, including: an image capturing unit capable of capturing an image of the target as image information having color information including RGB values; and a determination unit configured to determine presence or absence of defects in the target based on the color information of the image information of the image captured by the image capturing unit, wherein the determination unit is configured to define, for each pixel, criteria for determining presence or absence of defects in each pixel of the image information, based on the color information in a defect-free region of the target captured by the image capturing unit, and to filter all pixels in the image information of the image captured by the image capturing unit so as to determine presence or absence of defects in each pixel, based on the defined criteria.