The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Feb. 07, 2017
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Naoya Fukuoka, Tokyo, JP;

Hiroki Kawano, Tokyo, JP;

Tomooki Ukiana, Tokyo, JP;

Toshihiro Mega, Tokyo, JP;

Tomohiro Narui, Tokyo, JP;

Tomohiro Sato, Tokyo, JP;

Hiroto Takahashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/58 (2019.01); G06F 16/538 (2019.01); G06F 16/535 (2019.01); G06F 16/25 (2019.01); G06F 30/12 (2020.01);
U.S. Cl.
CPC ...
G06F 16/5866 (2019.01); G06F 16/258 (2019.01); G06F 16/535 (2019.01); G06F 16/538 (2019.01); G06F 30/12 (2020.01);
Abstract

A control method analysis unit acquires a correspondence relation between signs and model numbers from an apparatus table of an instrumentation diagram, and acquires signs and apparatus symbols, and connection relation among apparatuses, from a drawing of the instrumentation diagram. Subsequently, the control method analysis unit acquires an apparatus classification drawn on the diagram by searching an instrumentation apparatus classification database based on the model numbers, and decides a temperature control method employed by an instrumentation indicated in the instrumentation diagram, from the apparatus classification and the connection relation. The control method analysis unit then links the decided temperature control method to the instrumentation diagram accumulated in a case database. A search processing unit extracts a corresponding instrumentation diagram by searching the case database based on a temperature control method designated as a search condition.


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