The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Dec. 11, 2018
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Karen J. Smiley, Raleigh, NC (US);

Pankeshkumar Gopalbhai Patel, College Park, MD (US);

David N. Cox, Raleigh, NC (US);

Assignee:

ABB Schweiz AG, Baden, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2457 (2019.01); G06F 16/9538 (2019.01); G06F 16/9535 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24578 (2019.01); G06F 16/9535 (2019.01); G06F 16/9538 (2019.01);
Abstract

Unique systems, methods, techniques and apparatuses for ranking and applying industrial analysis search results are disclosed. One exemplary embodiment is a computer implemented method comprising receiving a request to rank potential combinations of the data set and the plurality of data analysis tools; tagging the plurality of data analysis tools with one or more metadata tags selected from a plurality of metadata tags; tagging the data set with one or more metadata tags selected from the plurality of metadata tags; scoring a plurality of potential combinations of the data analysis tool and the plurality of data sets according to correspondence between the metadata tags tagged to the data analysis tool and the metadata tags tagged to each of the plurality of data sets; and outputting a user perceptible ranking of the plurality of potential combinations indicating the scoring.


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