The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Jan. 28, 2019
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Zheng Wang, Louisville, CO (US);

Ara Patapoutian, Hopkinton, MA (US);

Bengt Anders Ulriksson, Longmont, CO (US);

Assignee:

Seagate Technology LLC, Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01); G06F 11/10 (2006.01); G11C 11/56 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/008 (2013.01); G11C 11/5642 (2013.01); H03M 13/1111 (2013.01);
Abstract

Read parameter estimation techniques are provided that obtain information from multiple read operations to customize read parameters for data recovery. One method comprises performing the following steps, in response to a decoding failure of a page of a memory or a codeword of the memory: obtaining at least three read values of the page or codeword; and processing the at least three read values to determine read parameters comprising: (i) a log likelihood ratio, and/or (ii) a center read reference voltage, wherein the determination is based on a signal count of a number of bits falling in particular regions of multiple regions of the memory and wherein the determined read parameters are used for a decoding of the page or codeword following the decoding failure and/or a subsequent read operation following a successful decoding of the page or codeword.


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