The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Oct. 23, 2018
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Bing Liu, Tianjin, CN;

Man Lv, Beijing, CN;

Fang You, Wuhan, CN;

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); H04L 29/08 (2006.01); H04L 12/24 (2006.01); G06F 13/40 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/079 (2013.01); G06F 11/0727 (2013.01); G06F 11/0775 (2013.01); G06F 13/4022 (2013.01); H04L 41/069 (2013.01); H04L 41/0677 (2013.01); H04L 41/12 (2013.01); H04L 67/1097 (2013.01);
Abstract

Embodiments of the present disclosure relate to a method and device for identifying a problematic component in a storage system. The method comprises determining, based on history error logs of components of the storage system, a graph indicating error information of the components, where nodes in the graph indicate the components, and edges in the graph indicate connections between the components; the method further comprises identifying, based on the graph, an error source in the components of the storage system to be the problematic component. With the method and device of the present disclosure, the error source in the storage system can be identified more accurately and effectively and user experience can be enhanced.


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