The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Jan. 22, 2019
Fanuc Corporation, Yamanashi, JP;
Susumu Maekawa, Yamanashi, JP;
Hirohide Tsunoda, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An abnormality determination apparatus, which determines abnormality of a temperature sensor in a machine tool, includes: a temperature pattern storage unit which stores a normal pattern indicating temperature change relative to machining time for a machining classification of the machine tool; a temperature data acquisition unit which acquires temperature data outputted by the temperature sensor provided to the machine tool; a machining classification determination unit which determines a machining classification of the machine tool; a comparison data acquisition unit which extracts the normal pattern relative to a determined machining classification from the temperature pattern storage unit; a comparison unit which compares the extracted normal pattern, and as acquired pattern indicating temperature change relative to machining time according to the acquired temperature data; and an abnormality determination unit which determines abnormality of a temperature sensor based on a comparison result.