The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Mar. 19, 2018
Applicant:
Omron Corporation, Kyoto, JP;
Inventors:
Gaku Shiramizu, Ayabe, JP;
Yuki Hirohashi, Nara, JP;
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/05 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 19/05 (2013.01); G05B 23/0235 (2013.01); G05B 2219/1101 (2013.01); G05B 2219/1134 (2013.01); G05B 2219/13175 (2013.01); G05B 2219/15055 (2013.01);
Abstract
A control apparatus for controlling a control target includes: an acquisition unit, a determination unit, and a delay time adding unit. The acquisition unit acquires at least first and second measurement values related to a control target, such as a machine. The determination unit determines whether the control target is in a predetermined state, such as a normal state or an abnormal state, based on the measurement values acquired by the acquisition unit. The delay time adding unit adds delay to at least one of the first and second measurement values.