The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Dec. 04, 2019
University of Massachusetts, Boston, MA (US);
David Grunwald, Worcester, MA (US);
Maximiliaan Huisman, Brookfield, MA (US);
Carlas Smith, Delft, NL;
University of Massachusetts, Boston, MA (US);
Abstract
The described embodiments are directed to a system and methods of calibrating a fluorescence microscope and/or light detection device using a calibrating apparatus. The apparatus may comprise a main body housing, a sensor head, and a microcontroller assembly disposed within the housing. The housing may include an adapter to mechanically couple the housing to a microscope. The sensor head may comprise (i) an optical power sensor to produce a power signal representative of an optical power magnitude of light applied to the optical power sensor, (ii) an optical wavelength sensor configured to produce wavelength information associated with the light applied to the optical wavelength sensor, and (iii) a light source configured to direct light toward a detection device associated with the microscope. The microcontroller assembly may be configured to generate an optical power magnitude value based on the power signal and adjusted according to the wavelength information.