The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Jul. 15, 2016
Applicant:

Carl Zeiss Vision International Gmbh, Aalen, DE;

Inventors:

Jesus-Miguel Cabeza-Guillen, Aalen, DE;

Subhashini Mani, Aalen, DE;

Michael Gamperling, Leipheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 13/00 (2006.01); A61B 3/00 (2006.01); A61B 3/11 (2006.01);
U.S. Cl.
CPC ...
G02C 13/005 (2013.01); A61B 3/0025 (2013.01); A61B 3/111 (2013.01);
Abstract

In a method for determining at least one fitting parameter for a spectacle lens received in a spectacle frame, an image, lying in an image plane, of at least one portion of a spectacle frame worn by a subject is acquired. When acquiring the image, the inclination of the image plane about a horizontal axis which is parallel to the image plane is established and, in the process, the at least one fitting parameter is established from the acquired image of the portion of the subject with the spectacle frame worn by the subject and the established inclination of the image.


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