The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Aug. 23, 2017
Sony Corporation, Tokyo, JP;
Kyoto University, Kyoto, JP;
Suguru Dowaki, Kanagawa, JP;
Shiori Oshima, Kanagawa, JP;
Eriko Matsui, Tokyo, JP;
Tatsutoshi Nakahata, Kyoto, JP;
Megumu Saito, Kyoto, JP;
Akira Niwa, Kyoto, JP;
Sony Corporation, Tokyo, JP;
Kyoto University, Kyoto, JP;
Abstract
An observation system includes a microscope optical system, an image pickup unit, an image pickup control unit, a detection unit, and an observation control unit. The image pickup unit is configured to take an image of a field-of-view range of the microscope optical system. The image pickup control unit is configured to cause the image pickup unit to take images of an observation sample in the field-of-view range at a plurality of focal positions and generate detection images. The detection unit is configured to detect a three-dimensional position of an observation target object in the observation sample from the detection images. The observation control unit is configured to fit the field-of-view range of the microscope optical system to the three-dimensional position.