The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Oct. 08, 2019
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Woobum Kang, Osaka, JP;

Hayato Ohba, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/36 (2006.01); G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/365 (2013.01); G02B 21/368 (2013.01); G02B 21/02 (2013.01);
Abstract

A magnifying observation apparatus obtains a plurality of first luminance images by controlling an illumination section so as to illuminate an observation target with illumination light from a first illumination direction and controlling a change section and an imaging section so as to image the observation target, obtains a plurality of second luminance images by controlling the illumination section so as to illuminate the observation target with illumination light from a second illumination direction symmetric with the first illumination direction about an optical axis and controlling the change section and the imaging section so as to image the observation target in a plurality of different focal positions, and generates a roughness enhancement image that enhances roughness on the surface of the observation target by applying depth synthesis and roughness enhancement.


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