The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Aug. 11, 2016
Qualcomm Incorporated, San Diego, CA (US);
Tadeusz Jarosinski, San Diego, CA (US);
Volodimir Slobodyanyuk, San Diego, CA (US);
John Wyrwas, Mountain View, CA (US);
Manav Raina, San Diego, CA (US);
Elbert McLaren, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Disclosed herein are techniques for measuring a reference beam and a corresponding returned beam from a target in a measurement system using a single sensor array. The system is configured such that the location of the reference beam is space apart from the location of the returned beam on the sensor array. A first set of sensor elements on the sensor array corresponding to the reference beam is dynamically activated based on a laser beam scanning control signal. The detection signal from the first set of sensor elements is used to determine a location and/or a pattern of the reference beam, which are then used to estimate a location and/or a pattern of the corresponding returned beam on the same sensor array and dynamically select and activate a second set of sensor elements on the sensor array based on the estimated location and/or pattern of the corresponding returned beam.