The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Aug. 28, 2013
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Yuji Katsuyama, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/24 (2006.01); G01N 30/86 (2006.01); G01N 30/88 (2006.01);
U.S. Cl.
CPC ...
G01N 30/24 (2013.01); G01N 30/8658 (2013.01); G01N 30/88 (2013.01); G01N 2030/8804 (2013.01);
Abstract

A control device for automatic analysis including a unit which stores an analysis parameter file in which setting values of multiple setting items related to analytical equipment control are specified; a unit which describes at least identification information for the sample to be analyzed and the analytical parameters file to be used for analysis, for multiple analyses to be executed in the analysis device, and generates an analysis schedule table which describes setting values relating to one or more of the multiple setting items contained in the analytical parameters file for each analysis; and a control unit which controls the operation of the analytical equipment according to the analysis schedule table. The control unit is made such that the setting values specified in the analysis schedule table are applied preferentially for setting items for which the setting value is described in both the analytical parameter file and analysis schedule table.


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