The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Oct. 07, 2015
Shimadzu Corporation, Kyoto, JP;
Hideki Yamamoto, Kyoto, JP;
Tohru Shiohama, Kyoto, JP;
Hiroaki Kozawa, Kyoto, JP;
Atsushige Ikeda, Kyoto, JP;
Minoru Fujimoto, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
Under the control of an analysis control unit (), a mass spectrometer unit () performs a product-ion scan measurement for a target component in a target sample within a time range where the component is introduced. It also performs a scan measurement over an m/z range including the m/z of an ion originating from a standard component within the same segment of time. A mass correction information calculator () calculates mass correction information from measured and theoretical values of the m/z of the ion originating from the standard component observed on an MS spectrum obtained by the scan measurement. Using the mass correction information, a mass corrector () corrects the m/z of each ion peak originating from the target component observed on an MS/MS spectrum obtained by the product-ion scan measurement performed within the same cycle as the scan measurement concerned. It is possible to consider that the MS measurement and the MS/MS measurement within the same cycle have been almost simultaneously carried out. Accordingly, a mass correction which is almost equivalent to an internal standard method can be achieved.