The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Feb. 08, 2019
Leica Geosystems Ag, Heerbrugg, CH;
Matthias Saure, Buchs, CH;
Michael Lettau, Laufenburg, DE;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
An Augmented Reality (AR)-based inspection system comprising a coordinate measuring instrument having a first camera unit, a first computer unit, and a first communication unit, and an AR-device having a second camera unit, a second computer unit, and a second communication unit, wherein the first and the second communication units are connectable, each of the coordinate measuring instrument and the AR-device is configured for establishing a referenced status relative to a setting, at least one of the first and the second computer unit is configured for detecting two-dimensional or three-dimensional structured shapes in images captured by at least one of the first and second camera unit. The AR-device is configured for providing a real view of the setting, providing overlays onto the real view according to corresponding AR-data, wherein said AR-data are at least in part spatially associated with the detected structured shapes.