The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2021
Filed:
Nov. 23, 2016
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Peijun Chen, Beijing, CN;
Wei Zhao, Beijing, CN;
Yongtao Tan, Beijing, CN;
Rowland Saunders, Hartland, WI (US);
Assignee:
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); H04N 5/52 (2006.01); A61B 5/00 (2006.01); H04N 5/367 (2011.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
A61B 6/585 (2013.01); A61B 5/7225 (2013.01); H04N 5/52 (2013.01); A61B 5/72 (2013.01); A61B 6/58 (2013.01); H01L 27/14658 (2013.01); H04N 5/367 (2013.01);
Abstract
The present invention provides an X-ray detection device and an apparatus and method for calibrating an X-ray detector, the method for calibrating an X-ray detector comprising: retrieving a calibration parameter stored in the X-ray detector relative to the X-ray detector; and calibrating the X-ray detector according to the calibration parameter.