The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Oct. 14, 2015
Applicant:
Yamaha Hatsudoki Kabushiki Kaisha, Iwata, JP;
Inventors:
Kazushi Takama, Iwata, JP;
Jun Asai, Iwata, JP;
Assignee:
YAMAHA HATSUDOKI KABUSHIKI KAISHA, Shizuoka-ken, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 13/04 (2006.01); H05K 13/00 (2006.01); H05K 13/02 (2006.01); H05K 13/08 (2006.01);
U.S. Cl.
CPC ...
H05K 13/0465 (2013.01); H05K 13/083 (2018.08); H05K 13/0815 (2018.08); Y10T 29/49131 (2015.01); Y10T 29/53174 (2015.01); Y10T 29/53187 (2015.01); Y10T 29/53191 (2015.01);
Abstract
A substrate working system includes a component mounter that mounts a component on a substrate, and an inspection unit provided in the component mounter or a device downstream of the component mounter and that performs a substrate inspection different from a normal substrate inspection when an abnormality related to a mounting operation is detected in the component mounter.