The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Oct. 08, 2019
Applicant:
Fyusion, Inc., San Francisco, CA (US);
Inventors:
Stefan Johannes Josef Holzer, San Mateo, CA (US);
Abhishek Kar, Berkeley, CA (US);
Alexander Jay Bruen Trevor, San Francisco, CA (US);
Pavel Hanchar, Minsk, BY;
Matteo Munaro, San Francisco, CA (US);
Aidas Liaudanskas, San Francisco, CA (US);
Radu Bogdan Rusu, San Francisco, CA (US);
Assignee:
Fyusion, Inc., San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/271 (2018.01); G06T 7/593 (2017.01); G01C 21/32 (2006.01); G06F 16/29 (2019.01); H04N 13/243 (2018.01); G06T 19/00 (2011.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/271 (2018.05); G01C 21/32 (2013.01); G06F 16/29 (2019.01); G06T 7/593 (2017.01); G06T 19/006 (2013.01); H04N 13/243 (2018.05); G06T 2207/10028 (2013.01); H04N 2013/0081 (2013.01);
Abstract
Images of an object may be analyzed to determine individual damage maps of the object. Each damage map may represent damage to an object depicted in one of the images. The damage may be represented in a standard view of the object. An aggregated damage map for the object may be determined based on the individual damage maps.