The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Nov. 16, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Keita Yamaguchi, Tokyo, JP;

Yusuke Nakamura, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G02F 1/1343 (2006.01);
U.S. Cl.
CPC ...
H04N 5/232122 (2018.08); G02F 1/134309 (2013.01); H04N 5/232125 (2018.08); H04N 5/232939 (2018.08); G02F 2201/122 (2013.01);
Abstract

A distance measurement device is characterized in that the device includes: an image sensor configured to convert light to electrical signals to generate a sensor image; a modulator configured to modulate the intensity of light projected on the image sensor, based on a pattern for shooting; a complex information generating unit configured to generate, from the sensor image, complex information including a complex number; an evaluation index array generating unit configured to generate an evaluation index array, based on phase information of the complex information; and a distance information generating unit configured to generate distance information, based on the evaluation index array.


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