The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Dec. 23, 2019
Aisin Seiki Kabushiki Kaisha, Kariya, JP;
AISIN SEIKI KABUSHIKI KAISHA, Kariya, JP;
Abstract
An inspection device includes: an inspection pattern creating unit that creates an inspection pattern in which first regions each colored with a color different from each other and second regions each colored with a mixed color obtained by mixing at least two of colors with which the first regions are colored are alternately arranged; an irradiation unit that irradiates a surface of an inspection target with the inspection pattern while sliding the inspection pattern by a movement amount; a captured image acquisition unit that acquires a captured image obtained by imaging the surface of the inspection target irradiated with the inspection pattern; and a determination unit that generates color component images obtained by separating the acquired captured image for each of color components of the colors and determines whether or not there is a defect in the surface of the inspection target based on the color component images.