The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Apr. 18, 2019
Applicant:

Lg Electronics Inc., Seoul, KR;

Inventors:

Jae Hoon Chung, Anyang-si, KR;

Hyun Soo Ko, Anyang-si, KR;

Moon Il Lee, Anyang-si, KR;

Bin Chul Ihm, Anyang-si, KR;

Assignee:

LG ELECTRONICS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04B 17/345 (2015.01); H04B 17/373 (2015.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04L 43/08 (2013.01); H04B 17/345 (2015.01); H04B 17/373 (2015.01); H04L 5/0048 (2013.01);
Abstract

A method of measuring interference to perform efficient data communication is disclosed. A method of measuring interference of neighboring cells comprises allocating one or more first resource elements, to which pilot signals are allocated, to predetermined symbol regions included in a first resource block; allocating one or more second resource elements for measuring interference of the neighboring cells to a first symbol region of the predetermined symbol regions; and measuring interference of the neighboring cells using the one or more second resource elements.


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