The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
May. 27, 2020
Applicant:
Onu Technology Inc., San Jose, CA (US);
Inventors:
Guha Jayachandran, Cupertino, CA (US);
Volkmar Frinken, San Jose, CA (US);
Patrick Grinaway, Brooklyn, NY (US);
Galana Gebisa, Mountain View, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01); G16H 15/00 (2018.01); G16H 10/40 (2018.01);
U.S. Cl.
CPC ...
H04L 9/3218 (2013.01); G16H 10/40 (2018.01); G16H 15/00 (2018.01); H04L 9/3236 (2013.01); H04L 2209/12 (2013.01); H04L 2209/50 (2013.01);
Abstract
A method of cryptographically secured decentralized testing, includes receiving, by a computing device and from a secure test apparatus, an output of a cryptographic function of a secret test result identifier, authenticating the output, and recording, in a data repository, an indication of a test result as a function of the output.
Jayachandran, Guha. (2021). Methods and systems for cryptographically secured decentralized testing (U.S. Patent No. 10887104). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10887104
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile