The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

May. 17, 2018
Applicant:

Xi'an Jiaotong University, Shaanxi, CN;

Inventors:

Xiong Chen, Xian Shaanxi, CN;

Yongning He, Xian Shaanxi, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/11 (2015.01); H04B 17/00 (2015.01); H04B 17/10 (2015.01); G01R 31/11 (2006.01);
U.S. Cl.
CPC ...
H04B 17/11 (2015.01); H04B 17/0085 (2013.01); H04B 17/103 (2015.01); G01R 31/11 (2013.01);
Abstract

A dynamic dual-port passive intermodulation reference signal generator for calibrating an intermodulation testing device includes: a power allocation coupling network, a non-linear device located under a biasing condition, and a voltage modulation module. Extraction of a carrier signal is performed through a power distribution coupling network; the carrier signal as extracted excites a non-linear device to generate an intermodulation signal; this part of signal, together with the excitation signal, is coupled back to two ports of the generator by the same power distribution coupling network, thereby forming reflected and transmitted reference intermodulation levels as reference sources for calibrating the intermodulation testing apparatus. The voltage modulation generating module generates a voltage wave of a certain value, implementing modulation of the intermodulation signal; through the modulated intermodulation signal, the intermodulation testing region power level and intermodulation transient response feature within a nominal range are calibrated for the intermodulation testing device.


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