The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Feb. 22, 2018
Applicant:

Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventors:

Daniel Kilper, Tucson, AZ (US);

Weiyang Mo, Tucson, AZ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04J 14/02 (2006.01); H04B 10/077 (2013.01); H04B 10/079 (2013.01); H04B 10/50 (2013.01);
U.S. Cl.
CPC ...
H04B 10/0775 (2013.01); H04B 10/07955 (2013.01); H04B 10/503 (2013.01); H04J 14/02 (2013.01);
Abstract

A method is provided for determining the gain spectrum of an optical amplifier such as an erbium doped optical amplifier (EDFA). In accordance with the method, an optical amplifier such as an EDFA that is to accommodate a specified number of channels at different optical wavelengths is provided. A subset of the specified number of channels at which gain is to be measured is selected. The number of channels in the subset is determined based at least in part on a number of samples required by the Nyquist sampling theorem to reconstruct the gain spectrum. A gain value for each channel in the selected subset of channels is measured for a probe signal that does not perturb the gain spectrum of the EDFA by more than a prescribed amount. The gain spectrum for the EDFA is constructed from the measured gain values.


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