The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Sep. 24, 2018
Applicant:

National Chiao Tung University, Hsinchu, TW;

Inventors:

Hsie-Chia Chang, Hsinchu, TW;

Yen-Chin Liao, Hsinchu, TW;

Shu Lin, Milpitas, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/11 (2006.01); H03M 13/15 (2006.01);
U.S. Cl.
CPC ...
H03M 13/112 (2013.01); H03M 13/1137 (2013.01); H03M 13/1185 (2013.01); H03M 13/155 (2013.01); H03M 13/616 (2013.01);
Abstract

A low-density parity-check code scaling method is disclosed. The method includes following steps: obtaining the original low-density parity-check matrix; forming the permutation matrices with the random row shift or the random column shift to the identity matrix; replacing the component codes by the permutation matrices and the all-zero matrix to form the extended low-density parity-check matrix; adjusting the code length and the code rate to form the global coupled low-density parity-check matrix; and outputting the global coupled low-density parity-check code.


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