The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Mar. 05, 2019
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Masashi Ito, Tokyo, JP;

Eiichiro Fukuchi, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01F 1/058 (2006.01); H01F 1/053 (2006.01); H01F 1/055 (2006.01); C22C 38/00 (2006.01);
U.S. Cl.
CPC ...
H01F 1/058 (2013.01); C22C 38/005 (2013.01); H01F 1/055 (2013.01); H01F 1/0536 (2013.01); C22C 2202/02 (2013.01); Y10T 428/32 (2015.01);
Abstract

A rare earth permanent magnet that is high in residual magnetization and coercivity is obtained and includes R and T. A main phase of crystal grains having an NdFetype crystal structure is included. In an X-ray diffraction profile drawn by performing an XRD measurement for a rare earth permanent magnet, peaks of detected intensity are present in specific ranges. In which the detected intensity of the peak with the highest detected intensity in the range of 41.60°<2θ(°)<42.80° is set as α, the detected intensity of the peak with the highest detected intensity in the range of 34.38°<2θ(°)<34.64° is set as β, and the detected intensity of the peak with the highest detected intensity in the range of 38.70°<2θ(°)<41.20° is set as γ, 0.38<α/β<0.70 and 0.45<γ/β<0.70 are established. The peak with the highest detected intensity in the range of 34.38°<2θ(°)<34.64° is a peak derived from the NdFetype crystal structure.


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