The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Jun. 13, 2019
Sandisk Technologies Llc, Addison, TX (US);
Daniel Linnen, San Jose, CA (US);
Avinash Rajagiri, San Jose, CA (US);
Yuvaraj Krishnamoorthy, San Jose, CA (US);
Srikar Peesari, San Jose, CA (US);
Ashish Ghai, San Jose, CA (US);
Dongxiang Liao, San Jose, CA (US);
SanDisk Technologies LLC, Addison, TX (US);
Abstract
A method for detecting defects in a memory system includes receiving a command to perform a standard erase operation on at least one memory cell of the memory system. The method also includes performing a first defect detection operation on the at least one memory cell. The method also includes setting, in response to the first defect detection operation detecting a defect, a defect status indicator. The method also includes performing the standard erase operation on the at least one memory cell. The method also includes performing a second defect detection operation on the at least one memory cell. The method also includes setting, in response to the second defect detection operation detecting a defect, the defect status indicator.