The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Oct. 03, 2018
Applicant:

Magik Eye Inc., New York, NY (US);

Inventor:

Akiteru Kimura, Hachioji, JP;

Assignee:

Magik Eye Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/04 (2006.01); G08B 21/02 (2006.01); G08B 21/22 (2006.01); G08B 29/20 (2006.01); G08B 13/196 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G08B 21/0476 (2013.01); G08B 13/19645 (2013.01); G08B 21/0261 (2013.01); G08B 21/22 (2013.01); G08B 29/20 (2013.01); H04N 7/188 (2013.01);
Abstract

In an example, an apparatus includes a first sensor, a second sensor, and an integrated management system. The first sensor is for capturing a first set images of a calibration target that is placed in a monitored site, wherein the first sensor has a first position in the monitored site, and wherein a physical appearance of the calibration target varies when viewed from different positions within the monitored site. The second sensor is for capturing a second set of images of the calibration target, wherein the second sensor has a second position in the monitored site that is different from the first position. The integrated management system is for determining a positional relationship of the first sensor and the second sensor based on the first set of images, the second set of images, and knowledge of the physical appearance of the calibration target.


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