The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Aug. 08, 2018
Applicant:

Arkray, Inc., Kyoto, JP;

Inventors:

Shigeki Masuda, Kyoto, JP;

Yukio Watanabe, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G01N 15/147 (2013.01); G01N 15/1429 (2013.01); G01N 15/1434 (2013.01); G01N 15/1459 (2013.01); G01N 2015/144 (2013.01); G01N 2015/1445 (2013.01);
Abstract

Detection and analysis of a tangible component in a sample are implemented at lower cost. Provided is an analysis apparatus including a flow cell which includes a flow path for a sample, a branch section configured to cause light having passed through the flow path to branch at least to a first optical path and a second optical path, a first imaging section and a second imaging section configured to capture images of the sample in the flow path by using the light in the first optical path and the light in the second optical path, and a controller configured to process the captured images. The first imaging section and the second imaging section capture images that have the same angle of view but have different characteristics.


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