The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Oct. 16, 2018
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Weiming Li, Beijing, CN;
Yueying Kao, Beijing, CN;
Dongdong Yu, Beijing, CN;
Hao Wang, Beijing, CN;
Minsu Ahn, Yongin-si, KR;
Qiang Wang, Beijing, CN;
Sunghoon Hong, Suwon-si, KR;
Yang Liu, Beijing, CN;
Zairan Wang, Beijing, CN;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/73 (2017.01); G06N 3/08 (2006.01); G06T 7/11 (2017.01); G06T 7/60 (2017.01); G06T 7/55 (2017.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06N 3/08 (2013.01); G06T 7/11 (2017.01); G06T 7/50 (2017.01); G06T 7/55 (2017.01); G06T 7/60 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
Disclosed is an object pose estimating method and apparatus. The pose estimating method includes acquiring a two-dimensional (2D) image corresponding to an object, extracting a global visual feature and a local geometric feature of the object in the 2D image, and estimating a three-dimensional (3D) pose of the object based on the global visual feature and the local geometric feature.